D RAM Test Card (TEST & WBI)
The new standard for ultra-precision testing
Quick Specs
Size
PH300 (12”)
Max Pin Count
45K
Min Pad to Pad Pitch
85um
TRE (Test Resource Enhancement)
Max. 16 Shared
Frequency
≤ 100MHz
STF Substrate
MLC
NAND FLASH Test Card (TEST & WBI)
TEST & WBI
Wire Probe Card Solution
Optimized design for fine pitch and low leakage current testing.
| ⚡Performance | Low Leakage |
| 📏Min Pitch | 54.53um |
| 📍Max Pins | 2,850ea |
High-Performance Cobra Test Card
Powerful durability designed for mass production and high-speed testing.
MaxPin Count
Frequency
≥Current
Temp Range
Probe Force
Full Contact
Strait Vertical Test Card Solution
Optimized for Fine Pitch and High Speed
Performance: Fine Pitch Vertical Test Card
＜ 40㎛
＜ 5000 Pin
High Performance Cobra Test Card
Technical ParametersVertical MEMS Type
MaxPin Count
Frequency
≥Current
Temp Range
Probe Force
Full Contact
Technical ParametersVertical Straight Type
MaxPin Count
Frequency
≥Current
Temp Range
Probe Force
Full Contact
Next-Generation Medical Test Card
High-difficulty technology for medical device testing and packaging solutions
Compatible with Film and WLCSP
Pad, BGA, Cu – Pillar
Ultra & Fine Pitch
Change from Memory ~ Non Memory Test
Client Context
China 'I' Co. & Global Partners
Tester Compatibility
T5377, V93K
Pitch Range
500um ~
STF Type
MLWST
Ultra High-Density & High-Frequency
Ultra-Fine Pitch Precision
Customization
Providing optimal solutions tailored to customer requirements
Strait Probe Type
Pin < 3,000Pin
Cobra Probe Type
Pin 30,000Pin
MEMS Probe Type
Pin 50,000Pin